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Volumn 37, Issue 6, 1990, Pages 1961-1965

Estimation of Proton Upset Rates from Heavy Ion Test Data

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; MATHEMATICAL TECHNIQUES--APPROXIMATION THEORY; PROTONS;

EID: 0025660048     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.101215     Document Type: Article
Times cited : (39)

References (13)
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    • 0003832970 scopus 로고
    • AP-8 Trapped Proton Environment for Solar Maximum and Solar Minimum
    • NSSDC/WDC-A-R and S76-06, Goddard Space Flight Center, Greenbelt, MD, Dec.
    • D. M. Sawyer and L. I. Vette, “AP-8 Trapped Proton Environment for Solar Maximum and Solar Minimum,” NSSDC/WDC-A-R and S76-06, Goddard Space Flight Center, Greenbelt, MD, Dec. 1976.
    • (1976)
    • Sawyer, D.M.1    Vette, L.I.2
  • 3
    • 84942842319 scopus 로고
    • Nuclear Reactions in Semiconductors
    • Dec.
    • E. L. Petersen, “Nuclear Reactions in Semiconductors,” IEEE Trans. Nucl. Sci., NS-27, pp. 1494–1499, Dec. 1980.
    • (1980) IEEE Trans. Nucl. Sci. , vol.NS-27 , pp. 1494-1499
    • Petersen, E.L.1
  • 4
    • 33344455245 scopus 로고
    • Methods for Calculating SEU rates for Bipolar and MOS Circuits
    • Dec.
    • P. J. McNulty, W. G. Abdel-Kader and J. M. Bisgrove, “Methods for Calculating SEU rates for Bipolar and MOS Circuits,” IEEE Trans. Nucl. Sci., NS-32, pp. 4180–4184, Dec. 1985.
    • (1985) IEEE Trans. Nucl. Sci. , vol.NS-32 , pp. 4180-4184
    • McNulty, P.J.1    Abdel-Kader, W.G.2    Bisgrove, J.M.3
  • 6
    • 0020948470 scopus 로고
    • Suggested Single Event Upset Figure of Merit
    • Dec.
    • E. L. Petersen, J. B. Langworthy and S. E. Diehl, “Suggested Single Event Upset Figure of Merit,” IEEE Trans. Nucl. Sci., NS-30, pp. 4533–4539, Dec. 1983.
    • (1983) IEEE Trans. Nucl. Sci. , vol.NS-30 , pp. 4533-4539
    • Petersen, E.L.1    Langworthy, J.B.2    Diehl, S.E.3
  • 7
    • 0020890076 scopus 로고
    • Proton Upsets in Orbit
    • Dec.
    • W. L. Bendel and E. L. Petersen, “Proton Upsets in Orbit,” IEEE Trans. Nucl. Sci., NS-30, pp. 4481–4485, Dec. 1983.
    • (1983) IEEE Trans. Nucl. Sci. , vol.NS-30 , pp. 4481-4485
    • Bendel, W.L.1    Petersen, E.L.2
  • 9
    • 0024171214 scopus 로고
    • SEU Test Techniques for 256K Static Rams and Comparisons of Upsets Induced by Heavy Ions and Protons
    • Dec.
    • R. Koga, W. A. Kolasinski, J. V. Osborn, J. H. Elder and R. Chitty, “SEU Test Techniques for 256K Static Rams and Comparisons of Upsets Induced by Heavy Ions and Protons,” IEEE Trans. Nucl. Sci., NS-35, pp. 1638–1643, Dec. 1988.
    • (1988) IEEE Trans. Nucl. Sci. , vol.NS-35 , pp. 1638-1643
    • Koga, R.1    Kolasinski, W.A.2    Osborn, J.V.3    Elder, J.H.4    Chitty, R.5
  • 10
    • 0022189288 scopus 로고
    • Correlated Proton and Heavy Ion Measurements on IDT Static RAMS
    • Dec.
    • A. B. Campbell W. J. Stapor, R. Koga and W. A. Kolasinski, “Correlated Proton and Heavy Ion Measurements on IDT Static RAMS,” IEEE Trans. Nucl. Sci., NS-32, pp. 4150–4154, Dec. 1985.
    • (1985) IEEE Trans. Nucl. Sci. , vol.NS-32 , pp. 4150-4154
    • Campbell, A.B.1    Stapor, W.J.2    Koga, R.3    Kolasinski, W.A.4
  • 11
    • 0021594458 scopus 로고
    • A Summary of JPL Single Event Upset Test Data from May 1982 Through January 1984
    • Dec.
    • D. K. Nichols, W. E. Price, C. J. Malone and L. S. Smith, “A Summary of JPL Single Event Upset Test Data from May 1982 Through January 1984,” IEEE Trans. Nucl. Sci., NS-31, pp. 1186–1189, Dec. 1984.
    • (1984) IEEE Trans. Nucl. Sci. , vol.NS-31 , pp. 1186-1189
    • Nichols, D.K.1    Price, W.E.2    Malone, C.J.3    Smith, L.S.4
  • 12
    • 0020952139 scopus 로고
    • Charge Collection Measurments for Heavy Ions Incident on n- and p- Type Silicon
    • Dec.
    • T.R. Oldham and F. B. McLean, “Charge Collection Measurments for Heavy Ions Incident on n- and p- Type Silicon,” IEEE Trans. Nucl. Sci., NS-30, pp. 4493–4500, Dec. 1983.
    • (1983) IEEE Trans. Nucl. Sci. , vol.NS-30 , pp. 4493-4500
    • Oldham, T.R.1    McLean, F.B.2
  • 13
    • 0021621285 scopus 로고
    • Experimental Determination of SEU as a Function of Collected Charge in Bipolar Circuits
    • Dec.
    • J.A. Zoutendyk, C. J. Malone and L. S. Smith, “Experimental Determination of SEU as a Function of Collected Charge in Bipolar Circuits,” IEEE Trans. Nucl. Sci., NS-31, pp. 1167–1174, Dec. 1984.
    • (1984) IEEE Trans. Nucl. Sci. , vol.NS-31 , pp. 1167-1174
    • Zoutendyk, J.A.1    Malone, C.J.2    Smith, L.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.