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Volumn 108, Issue 10, 2008, Pages 4072-4124

Charge transport in nanoparticle assemblies

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS; BIOSENSORS; CHARGE TRANSFER; ION EXCHANGE; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; PHOTOELECTRIC RELAYS; SEMICONDUCTOR INSULATOR BOUNDARIES; SEPARATION; TWO DIMENSIONAL;

EID: 54849416127     PISSN: 00092665     EISSN: None     Source Type: Journal    
DOI: 10.1021/cr0680134     Document Type: Article
Times cited : (454)

References (486)
  • 9
    • 54849426381 scopus 로고    scopus 로고
    • Dunford, J. L. M.Sc. Thesis, Department of Chemistry, University of Toronto, Toronto, Canada, 2003.
    • Dunford, J. L. M.Sc. Thesis, Department of Chemistry, University of Toronto, Toronto, Canada, 2003.
  • 99
    • 0035900106 scopus 로고    scopus 로고
    • Chen, S. Langmuir 2001, 17, 6664.
    • (2001) Langmuir , vol.17 , pp. 6664
    • Chen, S.1
  • 153
    • 0030848621 scopus 로고    scopus 로고
    • Decher, G. Science 1997, 277, 1232.
    • (1997) Science , vol.277 , pp. 1232
    • Decher, G.1
  • 174
    • 0035353399 scopus 로고    scopus 로고
    • Chen, S. Langmuir 2001, 17, 2878.
    • (2001) Langmuir , vol.17 , pp. 2878
    • Chen, S.1
  • 208
    • 54849422806 scopus 로고    scopus 로고
    • Bunnell, D. A. Basic Principles of Scanning Probe Microscopy. In Scanning Probe Microscopy and Spectroscopy: Theory, Techniques and Applications; Bonnell, D. A., Ed.; Wiley: New York, 2001; p 7.
    • Bunnell, D. A. Basic Principles of Scanning Probe Microscopy. In Scanning Probe Microscopy and Spectroscopy: Theory, Techniques and Applications; Bonnell, D. A., Ed.; Wiley: New York, 2001; p 7.
  • 220
    • 27144483334 scopus 로고    scopus 로고
    • Bard, A. J, Mirkin, M. V, Eds, Dekker: New York
    • Bard, A. J. In Scanning Electrochemical Microscopy; Bard, A. J., Mirkin, M. V., Eds.; Dekker: New York, 2001; p 1.
    • (2001) Scanning Electrochemical Microscopy , pp. 1
    • Bard, A.J.1
  • 227
    • 0009886722 scopus 로고
    • Burstein, E, Lundqvist, S, Eds, Plenum: New.York
    • Duke, C. B. In Tunneling Phenomena in Solids; Burstein, E., Lundqvist, S., Eds.; Plenum: New.York, 1969; p 31.
    • (1969) Tunneling Phenomena in Solids , pp. 31
    • Duke, C.B.1
  • 228
    • 0002633794 scopus 로고
    • Charge Tunneling Rates in Ultrasmall Junctions
    • Grabert, H, Devoret, M. H, Eds, Plenum: New York
    • Ingold, G.-L.; Nazarov, Y. V. Charge Tunneling Rates in Ultrasmall Junctions. In Single Charge Tunneling; Grabert, H., Devoret, M. H., Eds.; Plenum: New York, 1992; p 21.
    • (1992) Single Charge Tunneling , pp. 21
    • Ingold, G.-L.1    Nazarov, Y.V.2
  • 244
    • 0000113067 scopus 로고
    • Altshuler, B. L, Lee, P. A, Webb R. A, Eds, Elsevier: Amsterdam
    • Averin, D. V.; Likharev, K. K. In Mesoscopic Phenomena in Solids; Altshuler, B. L., Lee, P. A., Webb R. A., Eds.; Elsevier: Amsterdam, 1991; p 173.
    • (1991) Mesoscopic Phenomena in Solids , pp. 173
    • Averin, D.V.1    Likharev, K.K.2
  • 277
    • 0042139459 scopus 로고
    • Introduction to Single Charge Tunneling
    • Grabert, H, Devoret, M. H, Eds, Plenum: New York
    • Devoret, M. H.; Grabert, H. Introduction to Single Charge Tunneling. In Single Charge Tunneling; Grabert, H., Devoret, M. H., Eds.; Plenum: New York, 1992; p 1.
    • (1992) Single Charge Tunneling , pp. 1
    • Devoret, M.H.1    Grabert, H.2
  • 310
    • 54849433781 scopus 로고    scopus 로고
    • Shk1ovskii, B. I.; Efros, A. L. Electronic Properties of Doped Semiconductors; Springer-Verlag: Berlin, 1984.
    • Shk1ovskii, B. I.; Efros, A. L. Electronic Properties of Doped Semiconductors; Springer-Verlag: Berlin, 1984.
  • 316
    • 54849421517 scopus 로고    scopus 로고
    • Feigel'man, M. V.; Ioselevich, A. S. Pis'ma Zh. Eksp. Teor. Fiz. 2005, 81, 341. i JETP Lett. 2005, 81, 227]
    • Feigel'man, M. V.; Ioselevich, A. S. Pis'ma Zh. Eksp. Teor. Fiz. 2005, 81, 341. i JETP Lett. 2005, 81, 227]
  • 427
    • 31544471079 scopus 로고    scopus 로고
    • Wang, J. Small 2005, 1, 1036.
    • (2005) Small , vol.1 , pp. 1036
    • Wang, J.1
  • 469


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