Discrete electron forces in a nanoparticle-tunnel junction system

Journal of Chemical Physics

Volumn 118, Issue 21, 2003, Pages 9769-9772

  Suganuma, Y ^a   Trudeau, P E ^a   Dhirani, A A ^a   Leathem, B ^b   Shieh, B ^b  

^a UNIVERSITY OF TORONTO   (Canada)

^b SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COULOMB BLOCKADE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TUNNELING; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; TEMPERATURE;

COULOMB STAIRCASE; MICROMECHANICAL SWITCHING; NANOPARTICLE-TUNNEL JUNCTION SYSTEM;

TUNNEL JUNCTIONS;

EID: 0038679494     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1571514     Document Type: Article

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