Shadow mask fabrication of micron-wide break-junctions and their application in single-nanoparticle devices

Nanotechnology

Volumn 18, Issue 45, 2007, Pages

  Zabet Khosousi, Amir ^a   Dhirani, Al Amin ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CHARGE TRAPPING; ELECTROMIGRATION; NANOPARTICLES; NANOTECHNOLOGY; TEMPERATURE MEASUREMENT;

BREAK JUNCTIONS; NANOGAPS; SHADOW MASK FABRICATION; THERMAL ACTIVATION ENERGIES;

MASKS;

DITHIOL DERIVATIVE; NANOPARTICLE;

ARTICLE; DEVICE; ELECTRIC POTENTIAL; ELECTRON; PRIORITY JOURNAL; TEMPERATURE;

EID: 36049013764     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/45/455305     Document Type: Article

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