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RT = g/[(2n - 1)ldR], with n = 50, number of electrode finger pairs; g = 10 μm, gap between electrodes; l = 1800 μm, overlap length of electrode fingers; and d = thickness of the film as determined by AFM (see Table 1). For all films, the thickness of the films was below the height of the electrodes, i.e., 100 nm.
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N = 0.71.
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