Conducting probe atomic force microscopy: A characterization tool for molecular electronics

Advanced Materials

Volumn 11, Issue 3, 1999, Pages 261-264

  Kelley, Tommie W ^a   Granstrom, Eric L ^a   Daniel Frisbie, C ^a  

^a University of Minnesota ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; CRYSTALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; THIN FILMS;

CONDUCTING PROBE ATOMIC FORCE MICROSCOPY (CPAFM);

MATERIALS SCIENCE;

EID: 0033077793     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4095(199903)11:3<261::AID-ADMA261>3.0.CO;2-B     Document Type: Article

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