Single-electron devices and their applications

Proceedings of the IEEE

Volumn 87, Issue 4, 1999, Pages 606-632

  Likharev, Konstantin K ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTROMETERS; ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; LOGIC CIRCUITS; RANDOM ACCESS STORAGE; TEMPERATURE; TRANSISTORS;

FLOATING GATE MEMORIES; FOWLER-NORDHEIM TUNNELING; SILICON TRANSISTORS; SINGLE ELECTRON DEVICE;

ELECTRON DEVICES;

EID: 0033116184     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/5.752518     Document Type: Article

References (224)

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