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Volumn 103, Issue 44, 1999, Pages 9394-9396

Controlled Etching of Au:SR Cluster Compounds

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EID: 0000842447     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp993229d     Document Type: Article
Times cited : (232)

References (39)
  • 22
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    • Schaaff, T. G. Ph.D. Dissertation, Georgia Institute of Technology, 1998.
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  • 23
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    • Ph.D. Dissertation, Georgia Institute of Technology
    • (b) Shafigullin, M. N. Ph.D. Dissertation, Georgia Institute of Technology, 1999.
    • (1999)
    • Shafigullin, M.N.1
  • 24
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    • Engelhard Industries, Inc.: U.S. Patent 3,163, 665, 1964
    • (a) Fitch, H. M. Engelhard Industries, Inc.: U.S. Patent 3,163, 665, 1964.
    • Fitch, H.M.1
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    • Engelhard Industries, Inc.: U.S. Patent 2,984, 575, 1961
    • (b) Fitch, H. M. Engelhard Industries, Inc.: U.S. Patent 2,984, 575, 1961.
    • Fitch, H.M.1
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    • Engelhard Industries, Inc.: U.S. Patent, 3,268, 568, 1961
    • (c) Fitch, H. M. Engelhard Industries, Inc.: U.S. Patent, 3,268, 568, 1961.
    • Fitch, H.M.1
  • 27
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    • note
    • (a) Mass spectrometry was performed on a custom-made reflectron time-of-flight mass spectrometer that uses a pulsed, space-focused, acceleration field. The negative ions are desorbed from "thick" films by a frequency-tripled Nd: YAG (355 nm) laser. The ions are then pulsed from the acceleration region at -5 kV, focused into a two-stage reflectron and then onto a conversion dynode/microchannel plate assembly, (b) Optical absorption spectra were obtained from dilute toluene solutions (∼0.5 mg/ mL) using a Perkin-Elmer Lambda-19 UV-vis-NIR double-beam spectrometer, (c) X-ray diffraction collected on drop cast films prepared from concentrated solutions (∼10 mg/mL) using a Scintag Advanced Diffraction System x 1 (Cu Kα, λ = 0.15405 nm).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.