Current-voltage characterisation of monolayer-supported Au-nanoclusters by scanning tunnelling microscopy under ambient conditions

European Journal of Inorganic Chemistry

Volumn , Issue 18, 2005, Pages 3683-3690

  Jacobsen, Volker ^a,b   Zhu, Tao ^a,c   Knoll, Wolfgang ^a   Kreiter, Maximilian ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b ETH ZURICH   (Switzerland)

^c PEKING UNIVERSITY   (China)

Author keywords

Colloids; Monolayers; Nanostructures; Scanning probe microscopy; Self assembly; Surface plasmon resonance

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; GOLD NANOPARTICLES; INFRARED SPECTROSCOPY; NANOCLUSTERS; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLED MONOLAYERS; SELF ASSEMBLY;

AMBIENT CONDITIONS; AU NANOCLUSTERS; CURRENT-VOLTAGE CHARACTERISTICS; CURRENT-VOLTAGE CHARACTERIZATION; DOUBLE-TUNNEL JUNCTIONS; GOLD NANOPARTICLE; GOLD SURFACES; SCANNING-PROBE MICROSCOPY; SUPPORTED AU; SURFACE-PLASMON RESONANCE;

SURFACE PLASMON RESONANCE;

EID: 25444466932     PISSN: 14341948     EISSN: None     Source Type: Journal    
DOI: 10.1002/ejic.200500270     Document Type: Article

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