Probing electrical transport in nanomaterials: Conductivity of individual carbon nanotubes

Science

Volumn 272, Issue 5261, 1996, Pages 523-526

  Dai, Hongjie ^a   Wong, Eric W ^a   Lieber, Charles M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; ELECTRONIC STRUCTURE; GOLD; LITHOGRAPHY; MICROSCOPIC EXAMINATION;

CARBON NANOTUBES; CONDUCTING PROBE TIP; ELECTRICAL TRANSPORT; MACROSCOPIC CONTACT;

NANOSTRUCTURED MATERIALS;

EID: 0030126336     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.272.5261.523     Document Type: Article

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33. We thank J. Liu and J Huang for help in the design and fabrication of the electronics used in these measurements C.M L. acknowledges partial support of this work by the Materials Research Science and Engineering Center of the National Science Foundation under award DMR-9400396 and by the Office of Naval Research