Electrostatic trapping of single conducting nanoparticles between nanoelectrodes

Applied Physics Letters

Volumn 71, Issue 9, 1997, Pages 1273-1275

  Bezryadin, A ^a   Dekker, C ^a   Schmid, G ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; ELECTRIC VARIABLES MEASUREMENT; ELECTROCHEMICAL ELECTRODES; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; NANOSTRUCTURED MATERIALS; POLARIZATION;

ELECTROSTATIC TRAPPING; NANOELECTRODES; SINGLE CONDUCTING NANOPARTICLES; TUNNEL BARRIER SUPPRESSION;

ELECTROSTATICS;

EID: 0031238258     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119871     Document Type: Article

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