Length-dependent transport in molecular junctions based on SAMs of alkanethiols and alkanedithiols: Effect of metal work function and applied bias on tunneling efficiency and contact resistance

Journal of the American Chemical Society

Volumn 126, Issue 43, 2004, Pages 14287-14296

  Engelkes, Vincent B ^a   Beebe, Jeremy M ^a   Frisbie, C Daniel ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALCOHOLS; ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; POLYCRYSTALLINE MATERIALS; SELF ASSEMBLY; SUBSTRATES; TRANSPORT PROPERTIES; TUNNEL JUNCTIONS;

CURRENT-VOLTAGE TRACES; MOLECULAR JUNCTIONS; NANOSCOPIC JUNCTIONS; WORK FUNCTIONS;

MOLECULAR STRUCTURE;

ALKANE DERIVATIVE; GOLD; NANOPARTICLE; PLATINUM; SILVER; THIOL DERIVATIVE;

ARTICLE; COATED PARTICLE; CRYSTAL STRUCTURE; ELECTRIC ACTIVITY; ELECTRIC CAPACITANCE; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT; ELECTRODE; MOLECULAR DYNAMICS; MOLECULAR INTERACTION;

EID: 7544229769     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja046274u     Document Type: Article

References (60)

1. Chen, J.; Reed, M. A.; Rawlett, A. M.; Tour, J. M. Science 1999, 286, 1550-1552.
2. Chen, J.; Calvet, L. C.; Reed, M. A.; Carr, D. W.; Grubisha, D. S.; Bennett, D. W. Chem. Phys. Lett. 1999, 313, 741-748.
3. Wang, W.; Lee, T.; Reed, M. A. Phys. Rev. B 2003, 68, 035416/035411-035416/035417.
4. Kushmerick, J. G.; Holt, D. B.; Pollack, S. K.; Ramer, M. A.; Yang, J. C.; Schull, T. L.; Naciri, J.; Moore, M. H.; Shashidhar, R. J. Am. Chem. Soc. 2002, 124, 10654-10655.
5. Kushmerick, J. G.; Holt, D. B.; Yang, J. C.; Naciri, J.; Moore, M. H.; Shashidhar, R. Phys. Rev. Lett. 2002, 89, 086802/086801-086802/086804.
6. Reed, M. A.; Zhou, C.; Muller, C. J.; Burgin, T. P.; Tour, J. M. Science 1997, 278, 252-254.
7. Park, H.; Park, J.; Lim, A. K. L.; Anderson, E. H.; Alivisatos, A. P.; McEuen, P. L. Nature 2000, 407, 58-60.
8. Slowinski, K.; Chamberlain, R. V., II; Bilewicz, R.; Majda, M. J. Am. Chem. Soc. 1996, 118, 4709-4710.
9. Holmlin, R. E.; Haag, R.; Chabinyc, M. L.; Ismagilov, R. P.; Cohen, A. E.; Terfort, A.; Rampi, M. A.; Whitesides, G. M. J. Am. Chem. Soc. 2001, 123, 5075-5085.
10. Selzer, Y.; Salomon, A.; Cahen, D. J. Phys. Chem. B 2002, 106, 10432-10439.
11. Liu, Y.-J.; Yu, H.-Z. ChemPhysChem 2003, 4, 335-342.
12. Wold, D. J.; Frisbie, C. D. J. Am. Chem. Soc. 2000, 122, 2970-2971.
13. Wold, D. J.; Frisbie, C. D. J. Am. Chem. Soc. 2001, 123, 5549-5556.
14. Wold, D. J.; Haag, R.; Rampi, M. A.; Frisbie, C. D. J. Phys. Chem. B 2002, 106, 2813-2816.
15. Cui, X. D.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Primak, A.; Moore, A. L.; Moore, T. A.; Gust, D.; Harris, C.; Lindsay, S. M. Nanotechnology 2002, 13, 5-14.
16. Labonte, A. P.; Tripp, S. L.; Reifenberger, R.; Wei, A. J. Phys. Chem. B 2002, 106, 8721-8725.
17. Fan, F.-R. F.; Yao, Y.; Cai, L.; Cheng, L.; Tour, J. M.; Bard, A. J. J. Am. Chem. Soc. 2004, 126, 4035-4042.
18. Liu, B.; Bard, A. J.; Mirkin, M. V.; Creager, S. E. J. Am. Chem. Soc. 2004, 126, 1485-1492.
19. Fan, F.-R. F.; Yang, J.; Cai, L.; Price, D. W., Jr.; Dirk, S. M.; Kosynkin, D. V.; Yao, Y.; Rawlett, A. M.; Tour, J. M.; Bard, A. J. J. Am. Chem. Soc. 2002, 124, 5550-5560.
20. Guisinger, N. P.; Greene, M. E.; Basu, R.; Baluch, A. S.; Hersam, M. C. Nano Lett. 2004, 4, 55-59.
21. Metzger, R. M. Chem. Rev. 2003, 103, 3803-3834.
22. Cui, X. D.; Primak, A.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Moore, A. L.; Moore, T. A.; Gust, D.; Nagahara, L. A.; Lindsay, S. M. J. Phys. Chem. B 2002, 106, 8609-8614.
23. Xiao, X.; Xu, B.; Tao, N. J. Nano Lett. 2004, 4, 267-271.
24. Donhauser, Z. J.; Mantooth, B. A.; Kelly, K. F.; Bumm, L. A.; Monnell, J. D.; Stapleton, J. J.; Price, D. W., Jr.; Rawlett, A. M.; Allara, D. L.; Tour, J. M.; Weiss, P. S. Science 2001, 292, 2303-2307.
25. Ramachandran, G. K.; Hopson, T. J.; Rawlett, A. M.; Nagahara, L. A.; Primak, A.; Lindsay, S. M. Science 2003, 300, 1413-1416.
26. Lau, C. N.; Stewart, D. R.; Williams, R. S.; Bockrath, M. Nano Lett. 2004, 4, 569-572.
27. Yaliraki, S. N.; Ratner, M. A. J. Chem. Phys. 1998, 109, 5036-5043.
28. Hong, S.; Reifenberger, R.; Tian, W.; Datta, S.; Henderson, J.; Kubiak, C. P. Superlattices Microstruct. 2000, 28, 289-303.
29. Seminario, J. M.; De La Cruz, C. E.; Derosa, P. A. J. Am. Chem. Soc. 2001, 123, 5616-5617.
30. Donhauser, Z. J.; Mantooth, B. A.; Pearl, T. P.; Kelly, K. F.; Nanayakkara, S. U.; Weiss, P. S. Jpn. J. Appl. Phys. 2002, 41, 4871-4877.
31. Cui, X. D.; Primat, A.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Moore, A. L.; Moore, T. A.; Gust, D.; Harris, G.; Lindsay, S. M. Science 2001, 294, 571-574.
32. Beebe, J. M.; Engelkes, V. B.; Miller, L. L.; Frisbie, C. D. J. Am. Chem. Soc. 2002, 124, 11268-11269.
33. Slowinski, K.; Fong, H. K. Y.; Majda, M. J. Am. Chem. Soc. 1999, 121, 7257-7261.
34. Holmlin, R. E.; Ismagilov, R. F.; Haag, R.; Mujica, V.; Ratner, M. A.; Rampi, M. A.; Whitesides, G. M. Angew. Chem., Int. Ed. 2001, 40, 2316-2320.
35. Selzer, Y.; Salomon, A.; Cahen, D. J. Am. Chem. Soc. 2002, 124, 2886-2887.
36. Liu, Y.-J.; Yu, H.-Z. ChemPhysChem 2002, 3, 799-802.
37. Smalley, J. F.; Feldberg, S. W.; Chidsey, C. E. D.; Linford, M. R.; Newton, M. D.; Liu, Y.-P. J. Phys. Chem. 1995, 99, 13141-13149.
38. Slowinski, K.; Chamberlain, R. V.; Miller, C. J.; Majda, M. J. Am. Chem. Soc. 1997, 119, 11910-11919.
39. Salomon, A.; Cahen, D.; Lindsay, S.; Tomfohr, J.; Engelkes, V. B.; Frisbie, C. D. Adv. Mater. 2003, 15, 1881-1890.
40. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559-3568.
41. Bain, C. D.; Troughton, E. B.; Tao, Y. T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321-335.
42. Rieley, H.; Kendall, G. K.; Zemicael, F. W.; Smith, T. L.; Yang, S. Langmuir 1998, 14, 5147-5153.
43. Deng, W.; Yang, L.; Fujita, D.; Nejoh, H.; Bai, C. Appl. Phys. A 2000, 71, 639-642.
44. Pethkar, S.; Aslam, M.; Mulla, I. S.; Ganeshan, P.; Vijayamohanan, K. J. Mater. Chem. 2001, 11, 1710-1714.
45. Simmons, J. G. J. Appl. Phys. 1963, 34, 1793-1803.
46. HOMO* and LUMO* refer to the HOMO and LUMO levels of the methylene chain. The true HOMO and LUMO levels are the highly localized bonding and antibonding orbitals resulting from the S-Au bond.
47. It is generally believed that some fraction of the applied bias in a molecular tunnel junction is dropped at each contact (η and 1 - η). In the case of perfectly symmetric I-V characteristics η = 0.5.
48. Datta, S.; Tian, W.; Hong, S.; Reifenberger, R.; Henderson, J. I.; Kubiak, C. P. Phys. Rev. Lett. 1997, 79, 2530-2533.
49. Tomfohr, J. K.; Sankey, O. F. Phys. Rev. B 2002, 65, 245105/245101- 245105/245112.
50. Dorneles, L. S.; Schaefer, D. M.; Carara, M.; Schelp, L. F. Appl. Phys. Lett. 2003, 82, 2832-2834.
51. Seine, G.; Coratger, R.; Carladous, A.; Ajustron, F.; Pechou, R.; Beauvillain, J. Phys. Rev. B 1999, 60, 11045-11050.
52. Duwez, A. S.; Di Paolo, S.; Ghijsen, J.; Riga, J.; Deleuze, M.; Delhalle, J. J. Phys. Chem. B 1997, 101, 884-890.
53. Whelan, C. M.; Barnes, C. J.; Walker, C. G. H.; Brown, N. M. D. Surf. Sci. 1999, 425, 195-211.
54. Kera, S.; Setoyama, H.; Kimura, K.; Iwasaki, A.; Okudaira, K. K.; Harada, Y.; Ueno, N. Surf. Sci. 2001, 482-485, 1192-1198.
55. Alloway, D. M.; Hofmann, M.; Smith, D. L.; Gruhn, N. E.; Graham, A. L.; Colorado, R., Jr.; Wysocki, V. H.; Lee, T. R.; Lee, P. A.; Armstrong, N. R. J. Phys. Chem. B 2003, 107, 11690-11699.
56. Tian, W.; Datta, S.; Hong, S.; Reifenberger, R.; Henderson, J. I.; Kubiak, C. P. J. Chem. Phys. 1998, 109, 2874-2882.
57. Datta, S. Superlattices Microstruct. 2000, 28, 253-278.
58. Xue, Y.; Datta, S.; Ratner, M. A. J. Chem. Phys. 2001, 115, 4292-4299.
59. Landauer, R. Phys. Lett. A 1981, 85, 91-93.
60. Nitzan, A. Annu. Rev. Phys. Chem. 2001, 52, 681-750.