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Journal of the American Chemical Society

Volumn 123, Issue 23, 2001, Pages 5549-5556

Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy

(2) Wold, D J a Frisbie, C D a

a University of Minnesota (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSFERS;

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; RELIABILITY; SELF ASSEMBLY;

TUNNEL JUNCTIONS;

ALKANE; GOLD; METAL; THIOL DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; CONDUCTANCE; DEFORMITY; ELECTRIC CURRENT; ELECTRIC POTENTIAL; ELECTROCHEMICAL ANALYSIS; ELECTRON TRANSPORT; METAL BINDING; MOLECULAR INTERACTION; THICKNESS;

EID: 0034832843 PISSN: 00027863 EISSN: None Source Type: Journal
DOI: 10.1021/ja0101532 Document Type: Article

Times cited : (559)

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