Clean electromigrated nanogaps imaged by transmission electron microscopy

Nano Letters

Volumn 6, Issue 3, 2006, Pages 441-444

  Strachan, Douglas R ^a,b   Smith, Deirdre E ^a   Fischbein, Michael D ^a   Johnston, Danvers E ^a   Guiton, Beth S ^b   Drndić, Marija ^a   Bonnell, Dawn A ^b   Johnson Jr , Alan T ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATED NANOGAPS; MOLECULAR SCALE ELECTRONICS; PARASITIC CONDUCTANCE PATH;

ELECTRODES; GOLD; INTERFACIAL ENERGY; SEMICONDUCTOR JUNCTIONS; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROMIGRATION;

EID: 33645388396     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl052302a     Document Type: Article

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