Elastic and inelastic electron tunneling in alkane self-assembled monolayers

Journal of Physical Chemistry B

Volumn 108, Issue 48, 2004, Pages 18398-18407

  Wang, Wenyong ^a   Lee, Takhee ^a,b   Reed, Mark A ^a  

^a Yale University   (United States)

^b Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

INELASTIC ELECTRON TUNNELING SPECTROSCOPY (IETS); MOLECULAR CHAINS; MOLECULAR ORBITALS; THERMAL EVAPORATION;

APPROXIMATION THEORY; CHARGE TRANSFER; CHEMICAL VAPOR DEPOSITION; ELECTRIC POTENTIAL; ELECTRON BEAM LITHOGRAPHY; ELECTRON TUNNELING; ENERGY GAP; EVAPORATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; MOLECULAR VIBRATIONS; PARAFFINS; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; X RAY SPECTROSCOPY;

SELF ASSEMBLY;

EID: 10444278249     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp048904k     Document Type: Review

References (91)

1. Reed, M. A.; Tour, J. M. Sci. Am. 2000, June, 86-93.
2. Reed, M. A.; Zhou, C.; Muller, C. J.; Burgin, T. P.; Tour, J. M. Science 1997, 278, 252-254.
3. Molecular Nanoelectronics; Reed, M. A., Lee, T., Eds.; American Scientific Publishers: Stevenson Ranch, CA, 2003.
4. (a) Heath, J. R.; Ratner, M. A. Phys. Today 2003, May, 43-49.
5. (b) Nitzan, A.; Ratner, M. A. Science 2003, 300, 1384-1389.
6. (a) Chen, Y.; Jung, G.-Y.; Ohlberg, D. A. A.; Li, X.; Stewart, D. R.; Jeppesen, J. O.; Nielsen, K. A.; Stoddart, J. F.; Williams, R. S. Nanotechnology 2003, 14, 462-468.
7. (b) Beyond Silicon: Breakthroughs in Molecular Electronics; http://www.hpl.hp.com/research/qsr/ (Hewlett-Packard Quantum Science Research).
8. (a) Luo, Y.; Collier, C. P.; Jeppesen, J. O.; Nielsen, K. A.; DeIonno, E.; Ho, G.; Perkins, J.; Tseng, H.-R.; Yamamoto, T.; Stoddart, J. F.; Heath, J. R. Chem. Phys. Chem. 2002, 3, 519-525.
9. (b) Collier, C. P.; Mattersteig, G.; Wong, E. W.; Luo, Y.; Beverly, K.; Sampaio, J.; Raymo, F. M.; Stoddart, J. F.; Heath, J. R. Science 2000, 289, 1172-1175.
10. (a) Stewart, D. R.; Ohlberg, D. A. A.; Beck, P. A.; Chen, Y.; Williams, R. S.; Jeppesen, J. O.; Nielsen, K. A.; Stoddart, J. F. Nano Lett. 2004, 4, 133-136.
11. (b) Lau, C. N.; Stewart, D. R.; Williams, R. S.; Bockrath, M. Nano Lett. 2004, 4, 569-572.
12. Lee, T.; Wang, W.; Klemic, J. F.; Zhang, J. J.; Su, J.; Reed, M. A. J. Phys. Chem. B 2004, 108, 8742-8750.
13. Ulman, A. An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly, Academic Press: Boston, 1991.
14. Poirier, G. E. Chem. Rev. 1997, 97, 1117-1127.
15. Ratner, M. A.; Davis, B.; Kemp, M.; Mujica, V.; Roitberg, A.; Yaliraki, S. In Molecular Electronics: Science and Technology; Aviram, A., Ratner, M., Eds.; Annals of the New York Academy of Sciences; New York Academy of Sciences: New York, 1998; Vol. 852.
16. 13 there is no experimental data on the HOMO-LUMO gap for the Au/alkanethiol SAM/Au system. A commonly used HOMO-LUMO gap for alkanethiol is 8 eV.
17. (a) Boulas, C.; Davidovits, J. V.; Rondelez, F.; Vuillaume, D. Phys. Rev. Lett. 1996, 76, 4797-4800.
18. (b) Fujihira, M.; Inokuchi, H. Chem. Phys. Lett. 1972, 17, 554-556.
19. (c) Lias, S. G.; Bartmess, J. E.; Liebman, J. F.; Holmes, J. L.; Levin, R. D.; Mallard, W. G. J. Phys. Chem. Ref. Data 1998, 17, 24.
20. (d) Yang, H.-H.; McCreery, R. L. Anal. Chem. 1999, 71, 4081.
21. Walczak, M. W.; Chung, C.; Stole, S. M.; Widrig, C. A.; Porter, M. D. J. Am. Chem. Soc. 1991, 113, 2370-2378.
22. Nuzzo, R. G.; Zegarski, B. R.; Dubois, L. H. J. Am. Chem. Soc. 1987, 109, 733-740.
23. Widrig, C. A.; Chung, C.; Porter, M. D. J. Electroanal. Chem. 1991, 310, 335-359.
24. Poirier, G. E.; Tarlov, M. J. Langmuir 1994, 10, 2853-2856.
25. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559-3568.
26. Bumm, L. A.; Arnold, J. J.; Dunbar, T. D.; Allara, D. L.; Weiss, P. S. J. Phys. Chem. B 1999, 103, 8122-8127.
27. Xu, B.; Tao, N. J. Science 2003, 301, 1221-1223.
28. Wold, D. J.: Frisbie, C. D. J. Am. Chem. Soc. 2001, 123, 5549-5556.
29. Wold, D. J.; Haag, R.; Rampi, M. A.; Frisbie, C. D. J. Phys. Chem. B 2002, 106, 2813-2816.
30. Cui, X. D.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Primak, A.; Moore, A. L.; Moore, T. A.; Gust, D.; Harris, G.; Lindsay, S. M. Nanotechnology 2002, 13, 5-14.
31. Cui, X. D.; Primak, A.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Moore, A. L.; Moore, T. A.; Gust, D.; Nagahara, L. A.; Lindsay, S. M. J. Phys. Chem. B 2002, 700, 8609-8614.
32. Holmlin, R.; Haag, R.; Chabinyc, M. L.; Ismagilov, R. F.; Cohen, A. E.; Terfort, A. Rampi, M. A.; Whitesides, G. M. J. Am. Chem. Soc. 2001, 123, 5075-5085.
33. Rampi, M. A.; Whitesides, G. M. Chem. Phys. 2002, 257, 373-391.
34. Slowinski, K.; Fong, H. K. Y.; Majda, M. J. Am. Chem. Soc. 1999, 121, 7257-7261.
35. York, R. L.; Nguyen, P. T.; Slowinski, K. J. Am. Chem. Soc. 2003, 725, 5948-5953.
36. Kushmerick, J. G.; Holt, D. B.; Pollack, S. K.; Ratner, M. A.; Yang, J. C.; Schull, T. L.; Naciri, J.; Moore, M. H.; Shashidhar, R. J. Am. Chem. Soc. 2002, 124, 10654-10655.
37. Smalley, J. F.; Feldberg, S. W.; Chidsey, C. E. D.; Linford, M. R.; Newton, M. D.; Liu, Y. J. Phys. Chem. 1995, 99, 13141-13149.
38. Weber, K.; Hockett, L.; Creager, S. J. Phys. Chem. B 1997, 101, 8286-8291.
39. Slowinski, K.; Chamberlain, R. V.; Miller, C. J.; Majda, M. J. Am. Chem. Soc. 1997, 119, 11910-11919.
40. Wang, W.; Lee, T.; Reed, M. A. Phys. Rev. B 2003, 68, 035416.
41. Wang, W.; Lee, T.; Kretzschmar, I.; Reed, M. A. Nano Lett. 2004, 4, 643-646.
42. Jaklevic, R. C.; Lambe, J. Phys. Rev. Lett. 1966, 17, 1139-1140.
43. Lambe, J.; Jaklevic, R. C. Phys. Rev. 1968, 765, 821-832.
44. Adkins, C. J.; Phillips, W. A. J. Phys. C: Solid State Phys. 1985, 18, 1313-1346.
45. Tunneling Spectroscopy: Capabilities, Applications, and New Techniques; Hansma, P. K., Ed.; Plenum: New York, 1982.
46. Stipe, B. C.; Rezaei, M. A.; Ho, W. Science 1998, 280, 1732-1735.
47. Zhou, C.; Deshpande, M. R.; Reed, M. A.; Jones, L., II; Tour, J. M. Appl. Phys. Lett. 1997, 71, 611-613.
48. (a) Chen, J.; Reed, M. A.; Rawlett, A. M.; Tour, J. M. Science 1999, 286, 1550-1552.
49. (b) Chen, J.; Calvet, L. C.; Reed, M. A.; Carr, D. W.; Grubisha, D. S.; Bennett, D. W. Chem. Phys. Lett. 1999, 313, 741-748.
50. Rails, K. S.; Buhrman, R. A.; Tiberio, R. C. Appl. Phys. Lett. 1989, 55, 2459-2461.
51. Ethanol and alkane molecules were purchased from Sigma-Aldrich.
52. Metzger, R. M.; Chen, B.; Holpfner, U.; Lakshmikantham, M. V.; Vuillaume, D.; Kawai, T.; Wu, X.; Tachibana, H.; Hughes, T. V.; Sakurai, H.; Baldwin, J. W.; Hosch, C.; Cava, M. P.; Brehmer, L.; Ashwell, G. J. J. Am. Chem. Soc. 1997, 119, 10455-10466.
53. Horowitz, P.; Hill, W. The Art of Electronics; Cambridge University Press: New York, 1989.
54. Sze, S. M. Physics of Semiconductor Devices; Wiley: New York, 1981.
55. (a) Thurstans, R. E.; Oxley, D. P. J. Phys. D: Appl. Phys. 2002, 35, 802-809.
56. (b) Simmons, J. G.; Verderber, R. R. Proc. R. Soc. London, Ser. A 1967, 301, 77-102.
57. (c) Dearnaley, G.; Stoneham, A. M.; Morgan, D. V. Rep. Prog. Phys. 1970, 33, 1129-1191.
58. (a) Mann, B.; Kuhn, H. J. Appl. Phys. 1971, 42, 4398-4405.
59. (b) Polymeropoulos, E. E.; Sagiv, J. J. Chem. Phys. 1978, 69, 1836-1847.
60. Fan, F. F.; Yang, J.; Cai, L.; Price, D. W.; Dirk, S. M.; Kosynkin, D. V.; Yao, Y.; Rawlett, A. M.; Tour, J. M.; Bard, A. J. J. Am. Chem. Soc. 2002, 124, 5550-5560.
61. Franz, W. In Handbuch der Physik; Flugge, S., Ed.; Springer-Verlag: Berlin, 1956; Vol. 17, p 155.
62. (a) Lewicki, G.; Mead, C. A. Phys. Rev. Lett. 1966, 16, 939-941.
63. (b) Stratton, R.; Lewicki, G.; Mead, C. A. J. Phys. Chem. Solids 1966, 27, 1599-1604.
64. (c) Parker, G. H.; Mead, C. A. Phys. Rev. Lett. 1968, 21, 605-607.
65. Brar, B.; Wilk, G. D.; Seabaugh, A. C. Appl. Phys. Lett. 1996, 69, 2728-2730.
66. Joachim, C.; Magoga, M. Chem. Phys. 2002, 281, 347-352.
67. Simmons, J. G. J. Appl. Phys. 1963, 34, 1793-1803.
68. (a) Simmons, J. G. J. Phys. D 1971, 4, 613-657.
69. (b) Maserjian, J.; Petersson, G. P. Appl. Phys. Lett. 1974, 25, 50-52.
70. Tomfohr, J. K.; Sankey, O. F. Phys. Rev. B 2002, 65, 245105.
71. (a) Yamamoto, H.; Waldeck, D. H. J. Phys. Chem. B 2002, 106, 7469-7473.
72. (b) Napper, A. M.; Liu, H.; Waldeck, D. H. J. Phys. Chem. B 2001, 105, 7699-7707.
73. Kaun, C.-C; Guo, H. Nano Lett. 2003, 3, 1521-1525.
74. Piccinin, S.; Selloni, A.; Scandolo, S.; Car, R.; Scoles, G. J. Chem. Phys. 2003, 119, 6729-6735.
75. Bryant, M. A.; Pemberton, J. E. J. Am. Chem. Soc. 1991, 113, 8284-8293.
76. Kato, H. S.; Noh, J.; Hara, M.; Kawai, M. J. Phys. Chem. B 2002, 106, 9655-9658.
77. Castiglioni, C.; Gussoni, M.; Zerbi, G. J. Chem. Phys. 1991, 95, 7144-7149.
78. The symbols δ, γ, and ν denote in-plane rocking (r) and scissoring (s), out-of-plane wagging (w) and twisting (t), and stretching modes, respectively.
79. (a) Molinari, M.; Rinnert, H.; Vergnat, M.; Weisbecker, P. Mater. Sci. Eng., B 2003, 101, 186.
80. (b) Bogdanoff, P. D.; Fultz, B.; Rosenkranz, S. Phys. Rev. B 1999, 60, 3976-3981.
81. (c) Mazur, U.; Hipps, K. W. J. Phys. Chem. 1982, 86, 2854-2860.
82. (a) Mazur, U.; Hipps, K. W. J. Phys. Chem. 1981, 85, 2244-2249.
83. (b) Kurata, H.; Hirose, M.; Osaka, Y. Jpn. J. Appl. Phys. 1981, 20, L811.
84. Kushmerick, J. G.; Lazorcik, J.; Patterson, C. H.; Shashidhar, R.; Seferos, D. S.; Bazan, G. C. Nano Lett. 2004, 4, 639-642.
85. Kirtley, J.; Hall, J. T. Phys. Rev. B 1980, 22, 848-856.
86. Lauhon, I. J.; Ho, W. Phys. Rev. B 1999, 60, R8525-R8528.
87. Klein, J.; Léger, A.; Belin, M.; Défourneau, D.; Sangster, M. J. L. Phys. Rev. B 1973, 7, 2336-2348.
88. Lauhon, L. J.; Ho, W. Rev. Sci. Instrum. 2001, 72, 216-223.
89. Kastner, M. A. Phys. Today 1993, January, 24-31.
90. Molecular Electronics: Science and Technology; Aviram, A., Ratner, M., Eds.; Annals of the New York Academy of Sciences; New York Academy of Sciences: New York, 1998; Vol. 852.
91. Reimers, J.; Picconatto, C.; Ellenbogen, J.; Shashidhar, R. In Molecular Electronics III; Annals of the New York Academy of Sciences; Reimers, J. R., Picconatto, C. A., Ellenbogen, J. C., Shashidhar, R., Eds.; New York Academy of Sciences: New York, 2003; Vol. 1006.