Probing correlated current and force effects of nanoparticle charge states by hybrid STM-AFM

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 24, 2002, Pages 2414051-2414054

  Suganuma, Y ^a   Trudeau, P E ^a   Dhirani, A A ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; FORCE; MEASUREMENT; MECHANICAL PROBE; NANOPARTICLE; PARTICLE SIZE; PHYSICAL MODEL; SCANNING TUNNELING MICROSCOPY;

EID: 0037116129     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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