Electronic transport in metal nanocrystal arrays: The effect of structural disorder on scaling behavior

Physical Review Letters

Volumn 87, Issue 18, 2001, Pages 1868071-1868074

  Parthasarathy, R ^a   Lin, X M ^a   Jaeger, H M ^a  

^a UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTRON BEAM LITHOGRAPHY; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; GOLD; METALLIC SUPERLATTICES; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY;

NANOCRYSTAL MONOLAYERS;

MONOLAYERS;

EID: 0035968839     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (29)