Near-field scanning optical microscopy studies of electronic and photonic materials and devices

Materials Science and Engineering: R: Reports

Volumn 33, Issue 1, 2001, Pages 1-50

  Hsu, Julia W P ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

Defect electronic properties; Near field scanning optical microscopy; Perovskite oxides; Photonic materials and devices; Semiconductors; Strain

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; OPTICAL PROPERTIES; OXIDE SUPERCONDUCTORS; PEROVSKITE; PHOTOCURRENTS; SEMICONDUCTING FILMS; SEMICONDUCTOR QUANTUM DOTS; STRAIN; STRESS RELAXATION; STRONTIUM COMPOUNDS; SUPERCONDUCTING FILMS; SURFACE TOPOGRAPHY; YTTRIUM BARIUM COPPER OXIDES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY (NSOM); PHOTONIC CRYSTALS; STRAIN EPITAXY; STRONTIUM TITANATE;

OPTICAL MICROSCOPY;

EID: 0035341673     PISSN: 0927796X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-796X(00)00031-0     Document Type: Article

References (245)

1. Near field optics