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Volumn 69, Issue 4, 1998, Pages 1747-1752

Evaluation of thermal evaporation conditions used in coating aluminum on near-field fiber-optic probes

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ALUMINUM; COATINGS; COMPOSITION; DEPOSITION; EVAPORATION; PROBES; SURFACE ROUGHNESS; THERMAL EFFECTS;

EID: 0032046056     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148836     Document Type: Article
Times cited : (32)

References (47)
  • 3
    • 0001581510 scopus 로고
    • edited by T. Mulvey and C. J. R. Sheppard Academic, London
    • D. W. Pohl, in Advances in Optical and Electron Microscopy, edited by T. Mulvey and C. J. R. Sheppard (Academic, London, 1991), Vol. 12, pp. 243-312.
    • (1991) Advances in Optical and Electron Microscopy , vol.12 , pp. 243-312
    • Pohl, D.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.