Facts and artifacts in near-field optical microscopy

Journal of Applied Physics

Volumn 81, Issue 6, 1997, Pages 2492-2498

  Hecht, B ^a,c   Bielefeldt, H ^a   Inouye, Y ^a,d   Pohl, D W ^a   Novotny, L ^b  

^a IBM RESEARCH ZURICH   (Switzerland)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c ETH ZURICH   (Switzerland)

^d OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4143135577     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363956     Document Type: Article

References (45)

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35. A similar approach is described in Ref. 32.
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44. Another good example of an SF-induced ghost image is depicted and correctly described in Fig. 5 of Ref. 8.
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