Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution

Applied Physics Letters

Volumn 73, Issue 11, 1998, Pages 1469-1471

  Hamann, H F ^a   Gallagher, A ^a   Nesbitt, D J ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FLUORESCENCE; LIGHT INTERFERENCE; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT SCATTERING; LIGHTING; MICROSCOPES; PHOTOMULTIPLIERS; RAMAN SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

HIGH SPATIAL RESOLUTION; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0032516947     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122176     Document Type: Article

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