Removing optical artifacts in near-field scanning optical microscopy by using a three-dimensional scanning mode

Journal of Applied Physics

Volumn 86, Issue 5, 1999, Pages 2785-2789

  Jordan, Claire E ^a   Stranick, Stephan J ^a   Richter, Lee J ^a   Cavanagh, Richard R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; GOLD; IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGING TECHNIQUES; PARTICLES (PARTICULATE MATTER); SURFACE TOPOGRAPHY;

CONSTANT-GAP MODE (CGM) TECHNIQUES; CONSTANT-HEIGHT MODE (CHM) TECHNIQUES; IMAGE ANALYSIS; NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM);

OPTICAL MICROSCOPY;

EID: 0032606428     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371126     Document Type: Article

References (30)

1. U. Durig, D. W. Pohl, and F. Rohner, J. Appl. Phys. 59, 3318 (1986).
2. E. Betzig and J. K. Trautman, Science 257, 189 (1992).
3. E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1992).
4. R. Toledo-Crow, P. C. Yang, Y. Chen, and M. Vaez-Iravani, Appl. Phys. Lett. 60, 2957 (1992).
5. B. Hecht, H. Bielefeldt, Y. Inouye, D. W. Pohl, and L. Novotny, J. Appl. Phys. 81, 2492 (1997).
6. V. Deckert, D. Zeisel, R. Zenobi, and T. Vo-Dinh, Anal. Chem. 70, 2646 (1998).
7. S. I. Bozhevolnyi, J. Opt. Soc. Am. B 14, 2254 (1997).
8. C. Durkan and I. V. Shvets, J. Appl. Phys. 83, 1171 (1998).
9. H. Bielefeldt, I. Horsch, G. Krausch, M. Luxsteiner, J. Mlynek, and O. Marti, Appl. Phys. A: Solids Surf. 59, 103 (1994).
10. G. A. Valaskovic, M. Holton, and G. H. Morrison, J. Microsc. 179, 29 (1995).
11. K. D. Weston and S. K. Buratto, J. Phys. Chem. B 101, 5684 (1997).
12. O. J. F. Martin, C. Girard, and A. Dereux, J. Opt. Soc. Am. A 13, 1801 (1996).
13. J. J. Greffet and R. Carminati, Prog. Surf. Sci. 56, 133 (1997).
14. R. L. Williamson, L. J. Brereton, M. Antognozzi, and M. J. Miles, Ultramicroscopy 71, 165 (1998).
15. J. P. Goudonnet, E. Bourillot, P. M. Adam, F. Defornel, L. Salomon, P. Vincent, M. Neviere, and T. L. Ferrell, J. Opt. Soc. Am. A 12, 1749 (1995).
16. H. Hatano, Y. Inouye, and S. Kawata, Opt. Lett. 22, 1532 (1997).
17. J. Levy, A. Cohen, and D. D. Awschalom, Rev. Sci. Instrum. 66, 3385 (1995).
18. B. Hecht, H. Bielefeldt, D. W. Pohl, L. Novotny, and H. Heinzelmann, J. Appl. Phys. 84, 5873 (1998).
19. D. Barchiesi, O. Bergossi, C. Pieralli, and M. Spajer, Ultramicroscopy 71, 361 (1998).
20. S. J. Stranick, L. J. Ritcher, and R. R. Cavanagh, J. Vac. Sci. Technol. B 16, 1948 (1998).
21. L. J. Richter, C. E. Jordan, R. R. Cavanagh, G. W. Bryant, A. Liu, S. J. Stranick, C. D. Keating, and M. J. Natan, J. Opt. Soc. Am. A (in press).
22. K. C. Grabar, K. R. Brown, C. D. Keating, S. J. Stranick, S. L. Tang, and M. J. Natan, Anal. Chem. 69, 471 (1997).
23. K. R. Brown and M. J. Natan, Langmuir 14, 726 (1998).
24. Certain commercial equipment or materials are identified to adequately specify the experimental procedure. This does not imply endorsement by the National Institute of Standards and Technology or that these are the best materials or equipment for the purpose.
25. U. D. Schwarz, H. Haefke, P. Reimann, and H. J. Guntherodt, J. Microsc. 173, 183 (1994).
26. C. Obermuller, K. Karrai, G. Kolb, and G. Abstreiter, Ultramicroscopy 61, 171 (1995).
27. C. E. Jordan, S. J. Stranick, and R. R. Cavanagh, Surf. Sci. (in press).
28. T. Huser, L. Novotny, T. Lacoste, R. Eckert, and H. Heinzelmann, J. Opt. Soc. Am. 16, 141 (1999).
29. H. F. Hamann, A. Gallagher, and D. J. Nesbitt, Appl. Phys. Lett. 73, 1469 (1998).
30. Y. Martin, F. Zenhausern, and H. K. Wickramasinghe, Appl. Phys. Lett. 68, 2475 (1996).