Investigation of excess carrier diffusion in nitride semiconductors with near-field optical microscopy

Applied Physics Letters

Volumn 74, Issue 6, 1999, Pages 850-852

  Vertikov, Andrey ^a   Ozden, Ilker ^a   Nurmikko, Arto V ^a  

^a Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; DIFFUSION; ELECTRON TRANSPORT PROPERTIES; LIGHT REFLECTION; NITRIDES; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS;

CARRIER DIFFUSION; ELECTRON HOLE;

CARRIER MOBILITY;

EID: 0033534832     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123387     Document Type: Article

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