Transmission near-field scanning microscope for infrared chemical imaging

Journal of Applied Physics

Volumn 86, Issue 5, 1999, Pages 2795-2799

  Dragnea, Bogdan ^a   Preusser, Jan ^a,c   Schade, Wolfgang ^a,c   Leone, Stephen R ^a,d   Hinsberg, William D ^b  

^a UNIVERSITY OF COLORADO   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

^c CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CHEMICAL BONDS; INFRARED IMAGING; INFRARED SPECTROSCOPY; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHOTORESISTS; POLYACRYLATES; REFRACTIVE INDEX; SURFACE TOPOGRAPHY; THIN FILMS;

INFRARED NEAR-FIELD SCANNING OPTICAL MICROSCOPY (IR-NSOM); PHOTOIMAGING;

PLASTIC FILMS;

EID: 0032606551     PISSN: 00218979     EISSN: None     Source Type: None    
DOI: 10.1063/1.371127     Document Type: Article

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