Spectrally resolved near-field mode imaging of vertical cavity semiconductor lasers

Journal of Applied Physics

Volumn 79, Issue 8 pt 1, 1996, Pages 3831-3834

  Horsch, I ^a   Kusche, R ^a   Marti, O ^a   Weigl, B ^a   Ebeling, K J ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRIC CONTACTS; ELECTRIC CURRENTS; GOLD; LASER MODES; LIGHT EMISSION; MULTILAYERS; OPTICAL MICROSCOPY; SPECTRUM ANALYSIS; SURFACE STRUCTURE;

CURRENT LIGHT CHARACTERISTICS; INJECTION CURRENTS; LASING WAVELENGTH; NEAR FIELD OPTICAL MICROSCOPY; VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 0030128289     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361810     Document Type: Article

References (10)