Characterisation of waveguide microcavities using high-resolution transmission spectroscopy and near-field scanning optical microscopy

IEE Proceedings: Optoelectronics

Volumn 145, Issue 6, 1998, Pages 379-383

  Vanderrhodes, G H ^a   Unlu M S ^a   Goldberg, B B ^a   Pomeroy, J M ^a   Krauss, T F ^a  

^a Boston University   (United States)

Author keywords

High resolution transmission spectroscopy. Scanning optical microscopy; Waveguide microca ities

Indexed keywords

DIFFRACTION GRATINGS; ELECTRIC FIELDS; LIGHT SCATTERING; OPTICAL MICROSCOPY; OPTOELECTRONIC DEVICES;

HIGH-RESOLUTION TRANSMISSION SPECTROSCOPY; NEAR-FIELD SCANNING OPTICAL MICROSCOPY; WAVEGUIDE MICROCAVITY;

OPTICAL WAVEGUIDES;

EID: 0032280403     PISSN: 13502433     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-opt:19982466     Document Type: Article

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