Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy

Applied Physics Letters

Volumn 72, Issue 15, 1998, Pages 1811-1813

  Vander Rhodes, G H ^a   Pomeroy, J M ^a   Unlu M S ^a   Goldberg, B B ^a   Knopp, K J ^b   Christensen, D H ^b  

^a BOSTON UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LIGHT EMISSION; MIRRORS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION; OPTICAL VARIABLES MEASUREMENT; SEMICONDUCTOR QUANTUM WELLS;

BRAGG REFLECTORS; PUMP INTENSITY PROFILE; SCANNING OPTICAL MICROSCOPY; TRANSFER MATRIX METHOD; VERTICAL CAVITY SURFACE EMITTING LASERS;

OPTICALLY PUMPED LASERS;

EID: 0032046317     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121192     Document Type: Article

References (9)

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