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Volumn 175, Issue 1, 1999, Pages 317-329

Interface applications of scanning near-field optical microscopy with a free electron laser

Author keywords

[No Author keywords available]

Indexed keywords

FREE ELECTRON LASERS; IMAGE ANALYSIS; INTERFACES (MATERIALS); OPTICAL FIBERS; OPTICAL MICROSCOPY;

EID: 0032594859     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199909)175:1<317::AID-PSSA317>3.0.CO;2-M     Document Type: Article
Times cited : (4)

References (29)
  • 21
    • 0028748246 scopus 로고
    • Conf. Interferometry 94
    • Warsaw 1994
    • O. BERGOSSI and M. SPAJER, Conf. Interferometry 94, Warsaw 1994, Proc. SPIE 2341, 239 (1994).
    • (1994) Proc. SPIE , vol.2341 , pp. 239
    • Bergossi, O.1    Spajer, M.2
  • 28
    • 0021464515 scopus 로고
    • R. BONIFACIO, C. PELLEGRINI, and L. NARDUCCI, Opt. Commun. 50, 373 (1984); A VUV Free Electron Laser at the TESLA Test Facility at DESY - Conceptual Design Report, TESLA-FEL 95-03, DESY Print, Hamburg 1995.
    • (1984) Opt. Commun. , vol.50 , pp. 373
    • Bonifacio, R.1    Pellegrini, C.2    Narducci, L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.