The probe dynamics under shear force in near-field scanning optical microscopy

Journal of Applied Physics

Volumn 83, Issue 7, 1998, Pages 3461-3468

  Wei, P K ^a   Fann, W S ^a,b  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001639302     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366557     Document Type: Article

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