Photonic-bandgap microcavities in optical waveguides

Nature

Volumn 390, Issue 6656, 1997, Pages 143-145

  Foresi, J S ^a   Villeneuve, P R ^b   Ferrera, J ^c   Thoen, E R ^c   Steinmeyer, G ^c   Fan, S ^b   Joannopoulos, J D ^b   Kimerling, L C ^a   Smith, Henry I ^c   Ippen, E P ^b,c  

^a USA   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; SILICON DIOXIDE;

ARTICLE; CALCULATION; DEVICE; ELECTROMAGNETIC RADIATION; ELECTRON BEAM; INFRARED RADIATION; LIGHT; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SPECTRAL SENSITIVITY; X RAY;

EID: 0030725654     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/36514     Document Type: Article

References (10)

1. Joannopoulos, J. D., Villeneuve, P. R. & Fan, S. Photonic crystals: putting a new twist on light. Nature 386, 143-149 (1997).
2. Soukoulis, C. M. (ed.) Photonic Band Gap Materials (Kluwer, Dordrecht, 1996).
3. Joannopoulos, J. D., Meade, R. D. & Winn, J. N. Photonic Crystals (Princeton, New York, 1995).
4. Yablonovitch, E. Photonic band-gap structures. J. Opt. Soc. Am. B 10, 283-295 (1993).
5. Kraus, T., De La Rue, R. & Band, S. Two-dimensional photonic bandgap structures operating at near-infrared wavelengths. Nature 383, 699-702 (1996).
6. Grüning, U., Lehmann, V., Ottow, S. & Busch, K. Macroporous silicon with a complete two-dimensional photonic bandgap centered at 5 μm. Appl. Phys. Lett. 68, 747-749 (1996).
7. Fan, S., Winn, J. N., Devenyi, A., Chen, J. C., Meade, R. D. & Joannopoulos, J. D. Guided and defect modes in periodic dielectric waveguides. J. Opt. Soc. Am. B 12, 1267-1272 (1995).
8. Yang, I. Y. et al. Combining and matching optical, e-beam and x-ray lithographies in the fabrication of Si CMOS circuits with 0.1 and sub-0.1 μm features. J. Vacuum Sci. Technol. B 13, 2741-2744 (1995).
9. Foresi, J. S. thesis, MIT (1997).
10. Yokoyama, H. & Brorson, S. D. Rate equation analysis of microcavity lasers. J. Appl. Phys. 66, 4801-4805 (1989).