High-quality near-field optical probes by tube etching

Applied Physics Letters

Volumn 75, Issue 2, 1999, Pages 160-162

  Stöckle, Raoul ^a   Fokas, Christian ^a   Deckert, Volker ^a   Zenobi, Renato ^a   Sick, Beate ^a   Hecht, Bert ^a   Wild, Urs P ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; OPTICAL FIBERS; OPTICAL MICROSCOPY; PROBES;

TUBE ETCHING;

ETCHING;

EID: 0038161400     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124305     Document Type: Article

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