Beam divergence and waist measurements of laser diodes by near-field scanning optical microscopy

Applied Physics Letters

Volumn 70, Issue 6, 1997, Pages 688-690

  Herzog, W D ^a   Unlu M S ^a   Goldberg, B B ^a   Rhodes, G H ^a   Harder, C ^b  

^a BOSTON UNIVERSITY   (United States)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CALCULATIONS; LASER BEAMS; LASER MODES; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM WELLS;

ASTIGMATISM; GAUSSIAN BEAMS; GRADED INDEX SEPARATE CONFINEMENT HETEROJUNCTION; LASER BEAM DIVERGENCE; LASER BEAM WAISTS; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0031079343     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118258     Document Type: Article

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