High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling

Applied Physics Letters

Volumn 72, Issue 24, 1998, Pages 3115-3117

  Veerman, J A ^a   Otter, A M ^a   Kuipers, L ^a   Van Hulst, N F ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000055999     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121564     Document Type: Article

References (18)

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