Locally enhanced Raman spectroscopy with an atomic force microscope

Applied Physics Letters

Volumn 76, Issue 21, 2000, Pages 3130-3132

  Anderson, Mark S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000518833     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126546     Document Type: Article

References (23)

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