Tip-sample interaction in a "shear-force" near-field scanning optical microscope

Review of Scientific Instruments

Volumn 70, Issue 9, 1999, Pages 3609-3613

  Hsu, Kate ^a   Gheber, Levi A ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001058955     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149967     Document Type: Article

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