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Applied Physics Letters

Volumn 74, Issue 1, 1999, Pages 61-63

Femtosecond near-field optical spectroscopy of implantation patterned semiconductors

(5) Nechay, B A a Siegner, U a Morier Genoud, F a Schertel, A a Keller, U a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DYNAMICS; DIFFRACTION LIMITED PUMP; FEMTOSECOND RESOLVED NEAR FIELD SCANNING OPTICAL MICROSCOPE; FOCUSED ION BEAM;

CARRIER MOBILITY; ELECTRON ENERGY LEVELS; ION BEAMS; ION IMPLANTATION; MEASUREMENTS; MICROSCOPES; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPY; ULTRAFAST PHENOMENA;

OPTICAL MICROSCOPY;

EID: 0033521308 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.123133 Document Type: Article

Times cited : (56)

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