Nanometer-scale imaging of domains in ferroelectric thin films using apertureless near-field scanning optical microscopy

Applied Physics Letters

Volumn 73, Issue 22, 1998, Pages 3229-3231

  Hubert, Charles ^a   Levy, Jeremy ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; IMAGING TECHNIQUES; LIGHT POLARIZATION; THIN FILMS;

APERTURELESS NEAR FIELD SCANNING OPTICAL MICROSCOPY; FERROELECTRIC THIN FILMS; NANOMETER SCALE IMAGING;

OPTICAL MICROSCOPY;

EID: 0032583026     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122727     Document Type: Article

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