Probe-surface interaction in near-field optical microscopy: The nonlinear bending force mechanism

Applied Physics Letters

Volumn 68, Issue 3, 1996, Pages 307-309

  Gregor, M J ^a   Blome, P G ^a   Schofer J ^a   Ulbrich, R G ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); COMPUTER SIMULATION; ELASTICITY; FORCE CONTROL; GEOMETRY; INTEGRATION; RESONANCE; SCANNING ELECTRON MICROSCOPY; SUPERFLUID HELIUM; SURFACES;

BENDING FORCE; NEAR FIELD OPTICAL MICROSCOPY; PROBE SURFACE INTERACTION; SHEAR FORCE CONTROL; SURFACE TILT ANGLE;

OPTICAL MICROSCOPY;

EID: 0029752052     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116068     Document Type: Article

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