Scanning near-field optical spectroscopy and imaging using nanofabricated probes

Applied Physics Letters

Volumn 75, Issue 13, 1999, Pages 1824-1826

  Zhou, H ^a   Midha, A ^a   Mills, G ^a   Donaldson, L ^a   Weaver, J M R ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON BEAM LITHOGRAPHY; EMISSION SPECTROSCOPY; IMAGING TECHNIQUES; MICROMACHINING; NANOTECHNOLOGY; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR QUANTUM WIRES; SILICON NITRIDE;

DIRECT-WRITE ELECTRON-BEAM LITHOGRAPHY; SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);

PROBES;

EID: 0032606186     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124840     Document Type: Article

References (10)

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