Near-field scanning optical microscopy of cleaved vertical-cavity surface-emitting lasers

Semiconductor Science and Technology

Volumn 13, Issue 12, 1998, Pages 1364-1367

  DeAro, J A ^a   Weston, K D ^a   Herrick, R W ^b,c   Petroff, P M ^b   Buratto, S K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of California   (United States)

^c HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DEGRADATION; ELECTRIC CURRENTS; ELECTROLUMINESCENCE; LASER MODES; OPTICAL MICROSCOPY; SPECTROSCOPIC ANALYSIS;

DARK LINE DEFECTS (DLD); NEAR-FIELD OPTICAL SPECTROSCOPY (NFOS); NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM); VERTICAL-CAVITY SURFACE-EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0032303571     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/12/006     Document Type: Article

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