Brighter near-field optical probes by means of improving the optical destruction threshold

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 378-382

  Stockle R M ^a   Schaller, N ^a   Deckert, V ^a   Fokas, C ^a   Zenobi, R ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Metal coating; Metallization; Scanning near field optical microscopy; Scanning probe; Spectroscopy

Indexed keywords

CORROSION PREVENTION; METAL COATINGS; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ADHESION LAYER; ETCHED FIBERS; FIBRE PROBE; GLASS SURFACES; METALLISATION; NEAR-FIELD OPTICAL PROBES; OPTICAL-; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING PROBES; SMOOTH GLASS;

GLASS;

ALUMINUM; CHROMIUM; COBALT; GLASS; METAL; NICKEL; TITANIUM;

ADHESION; BRIGHTNESS; CONFERENCE PAPER; CORROSION; DESORPTION; DESTRUCTION; FIBER OPTICS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SURFACE PROPERTY;

EID: 0033064717     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00524.x     Document Type: Conference Paper

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