Anomalous index contrast due to point source illumination in scanning optical microscopy

Journal of Applied Physics

Volumn 81, Issue 6, 1997, Pages 2488-2491

  McDaniel, Eric B ^a   Hsu, J W P ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; FIBER OPTICS; GLASS; LIGHT REFRACTION; MATHEMATICAL MODELS; POLARIZATION; PROBES; REFRACTIVE INDEX; SILICATES;

FIBER OPTIC PROBE; IMAGE CONTRAST; LEAD SILICATE; NUMERICAL APERTURE; POINT SOURCE ILLUMINATION; SCANNING OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0031098129     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364310     Document Type: Article

References (10)

1. D. W. Pohl, Adv. Opt. Electron Microscopy 12, 243 (1991); E. Betzig and J. K. Trautman, Science 257, 189 (1992).
2. D. W. Pohl, Adv. Opt. Electron Microscopy 12, 243 (1991); E. Betzig and J. K. Trautman, Science 257, 189 (1992).
3. J. Levy, V. Nikitin, J. M. Kikkawa, D. D. Awschalom and N. Samarth. J. Appl. Phys. 79, 6095 (1996).
4. E. B. McDaniel and J. W. P. Hsu, J. Appl. Phys. 70, 1085 (1996).
5. J. W. P. Hsu, Mark Lee, and B. S. Deaver. Rev. Sci. Instrum. 66, 3177 (1995); Mark Lee, E. B. McDaniel, and J. W. P. Hsu, ibid. 67, 1468 (1996).
6. J. W. P. Hsu, Mark Lee, and B. S. Deaver. Rev. Sci. Instrum. 66, 3177 (1995); Mark Lee, E. B. McDaniel, and J. W. P. Hsu, ibid. 67, 1468 (1996).
7. Measured by Schott at 587.6 nm and calculated for 670 using the measured indices and Abbe numbers.
8. P. Lorrain and D. Corson, Electromagnetic Fields and Waves, 2nd ed. (W. H. Freeman, San Francisco, 1970).
9. The identification of the two glasses in the NSOM sample was verified using SEM microprobe.
10. While most bubbles do not break the sample surface since they do not show any topographic features, we have observed regions where there are large pits associated with the bubbles. We estimate that the sub-surface bubbles are within one wavelength from the surface. When we performed the experiment at the same place, but with the tip at one wavelength away from the sample surface, none of the circular dark features in Fig. 2(b) were resolved. Therefore, bubbles in the bulk of the sample will contribute only to a background signal.