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Volumn 22, Issue 8, 1997, Pages 27-30

Near-field scanning optical microscopy studies of materials and devices

(1)  Hsu, J W P a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRONIC PROPERTIES; NANOSTRUCTURED MATERIALS; OXIDE SUPERCONDUCTORS; PHOTOVOLTAIC CELLS; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SOLAR CELLS; THIN FILMS;

EID: 0031207764     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400033777     Document Type: Article
Times cited : (4)

References (43)
  • 2
    • 0021410769 scopus 로고
    • D.W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. 44 (1984) p. 651; A. Harootunian, E. Betzig, M. Isaacson, and A. Lewis, ibid. 49 (1986) p. 674.
    • (1984) Appl. Phys. Lett. , vol.44 , pp. 651
    • Pohl, D.W.1    Denk, W.2    Lanz, M.3
  • 9
    • 0000607356 scopus 로고    scopus 로고
    • Ibid.
    • Ibid., J. Appl. Phys. 79 (1996) p. 7743.
    • (1996) J. Appl. Phys. , vol.79 , pp. 7743
  • 18
    • 0028548969 scopus 로고
    • Ibid.
    • Ibid., Appl. Phys. Lett. 65 (1994) p. 2654.
    • (1994) Appl. Phys. Lett. , vol.65 , pp. 2654
  • 26
    • 0000545292 scopus 로고    scopus 로고
    • H.F. Ghami, B.B. Goldberg, C. Cates, P.D. Wang, C.M. Sotomayor Torres, M. Fritze, and A. Nurmikko, Superlattices and Microstructures 17 (1995) p. 15; Y. Toda, M. Kourogi, and M. Ohtsu, Appl. Phys. Lett. 69 (1996) p. 827.
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 827
    • Toda, Y.1    Kourogi, M.2    Ohtsu, M.3
  • 33
    • 4143069817 scopus 로고    scopus 로고
    • Ibid.
    • Ibid., Phys. Rev. B (1997).
    • (1997) Phys. Rev. B
  • 41
    • 0031102196 scopus 로고    scopus 로고
    • Diagnostic Techniques for Semiconductor Materials Processing II, edited by S.W. Pang, O.J. Glembocki, F.H. Pollak, F. Celii, and C.M. Sotomayor Torres Pittsburgh
    • A.H. LaRosa, B.I. Yakobson, and H.D. Hallen, in Diagnostic Techniques for Semiconductor Materials Processing II, edited by S.W. Pang, O.J. Glembocki, F.H. Pollak, F. Celii, and C.M. Sotomayor Torres (Mater. Res. Soc. Symp. Proc. 406, Pittsburgh, 1995); ibid., Appl. Phys. Lett. 70 (1997) p. 1656.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.406
    • LaRosa, A.H.1    Yakobson, B.I.2    Hallen, H.D.3
  • 42
    • 0031102196 scopus 로고    scopus 로고
    • ibid.
    • A.H. LaRosa, B.I. Yakobson, and H.D. Hallen, in Diagnostic Techniques for Semiconductor Materials Processing II, edited by S.W. Pang, O.J. Glembocki, F.H. Pollak, F. Celii, and C.M. Sotomayor Torres (Mater. Res. Soc. Symp. Proc. 406, Pittsburgh, 1995); ibid., Appl. Phys. Lett. 70 (1997) p. 1656.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 1656


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