Contrast enhancement using polarization-modulation scanning near-field optical microscopy (PM-SNOM)

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 333-340

  Lacoste, Th ^a   Huser, Th ^a   Prioli, R ^a   Heinzelmann, H ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; FLUORESCENCE; ION BEAMS; LIGHT; MOLECULES; POLARIZATION; SURFACES;

CONTRAST ENHANCEMENT; FOCUSED ION BEAM; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; BIREFRINGENCE; CONTRAST ENHANCEMENT; IMAGE ANALYSIS; MICROSCOPY; OPTICS; POLARIZATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032033252     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00093-4     Document Type: Article

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