Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy

Journal of Applied Physics

Volumn 82, Issue 2, 1997, Pages 510-513

  Huntington, S T ^a   Nugent, K A ^a   Roberts, A ^a   Mulvaney, P ^a   Lo, K M ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL ETCHING; EVANESCENT FIELD; OPTICAL FIELDS; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

ATOMIC FORCE MICROSCOPY; CALCULATIONS; CHARACTERIZATION; ETCHING; MATHEMATICAL MODELS; NUMERICAL METHODS; OPTICAL FIBERS; OPTICAL VARIABLES MEASUREMENT; PERFORMANCE; REFRACTIVE INDEX; SCANNING;

OPTICAL MICROSCOPY;

EID: 0031186084     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365608     Document Type: Article

References (9)

1. S. A. Cassidy and P. Yennadhiou, Electron. Lett. 23, 1385 (1987).
2. R. B. Dynott, J. Bello, and V. A. Handerek, Opt. Lett. 12, 287 (1987).
3. F. A. Muhammad and G. Stewart, Electron. Lett. 28, 1205 (1992).
4. Q. Zhong and D. Inniss, J. Lightwave Technol. 12, 1517 (1994).
5. D. J. Butler, K. A. Nugent, and A. Roberts, J. Appl. Phys. 75, 2753 (1994).
6. J. K. Trautman, E. Betzig, J. S. Weiner, D. J. DiGiovanni, T. D. Harris, and F. Hellman, J. Appl. Phys. 71, 4659 (1992).
7. D. J. Butler, A. Horsfall, K. A. Nugent, and A. Roberts, J. Appl. Phys. 77, 5514 (1995).
8. E. Yamashita and K. Atsuki, in Analysis Methods for Electromagnetic Wave Problems, edited by E. Yamashita (Artech, Boston, 1990), Chap. 3.
9. E. Betzig and J. K. Trautman, Science 257, 189 (1992).