A reflection near-field scanning optical microscope technique for subwavelength resolution imaging of thin organic films

Journal of Physical Chemistry B

Volumn 101, Issue 29, 1997, Pages 5684-5691

  Weston, Kenneth D ^a   Buratto, Steven K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT INTERFERENCE; MULTILAYERS; OPTICAL MICROSCOPY; REFRACTIVE INDEX; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES; SURFACE STRUCTURE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY (NSOM); SELF ASSEMBLED MULTILAYER;

THIN FILMS;

EID: 0031192859     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp963856s     Document Type: Article

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