Near-Field Surface-Enhanced Raman Imaging of Dye-Labeled DNA with 100-nm Resolution

Analytical Chemistry

Volumn 70, Issue 13, 1998, Pages 2646-2650

  Deckert, Volker ^a   Zeisel, Dieter ^a   Zenobi, Renato ^a   Vo Dinh, Tuan ^b  

^a ETH ZURICH   (Switzerland)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001010544     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac971304f     Document Type: Article

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