Focused ion-beam fabrication of fiber probes with well-defined apertures for use in near-field scanning optical microscopy

Applied Physics Letters

Volumn 72, Issue 24, 1998, Pages 3133-3135

  Pilevar, Saeed ^a   Edinger, Klaus ^a   Atia, Walid ^a   Smolyaninov, Igor ^a   Davis, Christopher ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000795688     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121570     Document Type: Article

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