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Volumn 72, Issue 24, 1998, Pages 3133-3135

Focused ion-beam fabrication of fiber probes with well-defined apertures for use in near-field scanning optical microscopy

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[No Author keywords available]

Indexed keywords


EID: 0000795688     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121570     Document Type: Article
Times cited : (54)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.