Applications of scanning probe-atomic force microscopy in nanobioelectronics

Journal of Nanoscience and Nanotechnology

Volumn 14, Issue 1, 2014, Pages 924-931

  Choi, Eunmi ^a   Kim, Areum ^a   Son, Hyungbin ^a   Pyo, Sung Gyu ^a  

^a Chung Ang University   (South Korea)

Author keywords

Atomic force microscopy; Bonding strength; Nanobioelectronics; Scanning probe microscopy

Indexed keywords

BIOLOGICAL APPLICATIONS; BIOLOGICAL FIELDS; BONDING STRENGTH; CELL INTERACTION; ENVIRONMENTAL CHANGE; NANOBIOELECTRONICS; NANOSCALE RESOLUTIONS; SURFACE OF MATERIALS;

ATOMIC FORCE MICROSCOPY; SCANNING PROBE MICROSCOPY; TOOLS;

NANOTECHNOLOGY;

ATOMIC FORCE MICROSCOPY; CELL FUNCTION; CELL SEPARATION; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; MICROMANIPULATION; NANOTECHNOLOGY; PROTEIN ANALYSIS; REVIEW;

CELL PHYSIOLOGICAL PHENOMENA; CELL SEPARATION; ELECTRONICS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; PROTEIN INTERACTION MAPPING;

EID: 84893743251     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2014.8759     Document Type: Review

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