Force calibration in lateral force microscopy

Journal of Colloid and Interface Science

Volumn 227, Issue 1, 2000, Pages 55-65

  Cain, Robert G ^a   Biggs, Simon ^a   Page, Neil W ^a  

^a UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

Atomic force microscopy; Contact stiffness; Friction; Silica

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; FORCE; FRICTION; MOLECULAR DYNAMICS; PRIORITY JOURNAL; SHEAR STRESS;

EID: 0034235240     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcis.2000.6840     Document Type: Article

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